i

Title of the course

MM 653: Characterisation of Materials

 

ii

Credit structure

L          T          P          C

6           0          0           6

 

iii

Pre-requisite, if any

None

 

iv

Course content

Stereographic Projections, X-ray diffraction, crystal structure and phase identification, resudual stress measurement and other applications, Outline of thermal analysis technique, description, of DTA/DSC/TGA techniques and instrumentation. applications and case studies. Optical microscopy - light optics, microscope components, possibilities and limitations. SCanning Electron Microscopy - Optics and performance of a SEM, Image interpretation, crystallographic information in a SEM, analytical microscopy. Transmission ELectron microscopy - construction and operation of aTEM, electron diffraction, image interpretation. IR- and Raman spectroscopy.

v

Texts/References

Metals handbook Vol.9 " Characterisation of Materials", 10th Edition, American Society of Meatls, Metals Park, OH, USA., 1986.H.H. Willard, L.L. Merrit, J.A. Dean and F.A. Settle, " Instrumental Methods of analysis", 6th edition, CBS Publishers & Distributors, Delhi, 1986.

 

vi

Instructor(s) name

Prof. S.Raman