i

Title of the course

MM 734 - Electrical Characterization of Materials

 

ii

Credit structure

L          T          P          C

3           0          0           3

 

iii

Pre-requisite, if any

None

 

iv

Course content

Conductivity measurements (bulk and thin films) ?? 2 and 4 probe measurements in metals, semiconductors and insulators. Hall effect, mobility, carrier concentration measurements. AC measurements ?? impedance and dielectric. Various sources ?? grain, grain boundary, space charge, electron. Activation energy. Optical measurements ?? band gap in semiconductors. Absorption measurements, photoconductivity, photoluminescence for defects. Ellipsometry. Work function measurement ?? UPS, metal-semiconductor contacts, Kelvin probe. IR and Raman spectroscopy. Ferro-electric and ferro-magnetic measurements.

 

v

Texts/References

Peter Stallinga, Electrical Characterization of Organic Electronic Materials and Devices, Wiley,NJ, 2009Laszlo Solymar, Donald Walsh, Electrical Properties of Materials, Oxford University Press, 8thEd., 2010

vi

Instructor(s) name

Prof. Ajit Kulkarni