Title of the course

MM 684: X-Ray Diffraction and Electron Microscopy



Credit structure

L          T          P          C

6           0          0           6



Pre-requisite, if any




Course content

Introducltion to X-rays, filters. Atomic Scattering factors and structure factor. Intensity Calculations. Reciprocal Lattice. Ewald spehre construction. Techniques for structure determination. Point groups. Space groups. Systematic absences due to symmetry elements. Wyckoff Notation. Fourier series methods. Phase prolem. Patterson Function. Heavy atom methods. Anamolous scattering. Finite size effects. Intensity distribution in reciprocal space. Particle size determination for polycrystalline samples. Introduction to electron microscopy, electrons and their interactions with the specimen, electron diffraction. TEM-construction, contrast mechanisms and some applications. Analytical microscopy. SEM.




L.C. Azaroff, Elements of X-ray Crystallography, McGraw Hill, NY, 1968.F.D. Bloss, Crystallography and Crystal Chemistry, Holt, Rinehart and Winston, NY, 1971.G. Thomas and M.T.Goringe, Transmission Electron Microscopy of Materials, John 011Wiley, 1979.M.V. Heimendahl, Electron Microscopy of Materials - An Introduction, Academic Press, 0111980.



Instructor(s) name

Prof. Prasanna T.R.S.,Samajdar I.